18th Asian Test Symposium, ATS'09


The 18th Asian Test Symposium
November 23-26, 2009, Evergree Laurel Hotel, Taichung, Taiwan

Sponsored by

IEEE Computer Society
Test Technology Technical Council
National Chung Hsing University, Taiwan
In cooperation with

National Tsing Hua University, Taiwan
National Cheng Kung University, Taiwan
National Science Council, Taiwan
Ministry of Education, Taiwan
Industrial Tech. Research Inst., Taiwan
Taiwan Institute of Electrical and Electronics Engineering

General Co-Chair(s)
Shi-Yu Huang
National Tsing Hua Univ., Taiwan
Ming-Der Shieh, NCKU
National Cheng Kung Univ., Taiwan

Program Chair
Sying-Jyan Wang
National Chung Hsing Univ., Taiwan

Tutorial Chair
Jing-Jia Liou
National Tsing Hua Univ., Taiwan

Publicity Chair
Katherine Shu-Min Li
National Sun Yat-sen Univ., Taiwan

Publication Chair
Tsung-Chu Huang
National Changhua Univ. of Education, Taiwan

Finance Chair
Der-Chen Huang
National Chung Hsing Univ., Taiwan
Local Arrangement Chair
Ching-Hwa Cheng
Feng Chia Univ., Taiwan

Registration Chair
Yen-Jen Chang
National Chung Hsing Univ., Taiwan

Industrial Arrangement Chair
Wu-Tung Cheng
Mentor Graphics Corporation, USA

Panel Chair
Anis Uzzaman
Cadence Design Systems, New York
North American Liaison
Alex Orailoglu
University of California at San Diego

European Liaison
Zebo Peng
Linkoping University, Sweden

Program Committee
Vishwani Agrawal Auburn University, USA
Krishnendu Chakrabarty Duke University, USA
Krishna Chakravadhanula Cadence Design Systems, USA
Soon-Jyh Chang National Cheng Kung University, Taiwan
Tsin-Yuan Chang National Tsing Hua University, Taiwan
Chia-Tso Chao National Chiao Tung University, Taiwan
Ji-Jan Chen Industrial Technology Research Institute, Taiwan
Jwu E Chen National Central University, Taiwan
Ching-Hwa Cheng Feng Chia University, Taiwan
Dipanwita Chowdhury Indian Institute of Technology, India
Patrick Girard LIRMM / CNRS, France
Sandeep Gupta University of Southern California, USA
Masaki Hashizume University of Tokushima
Kazumi Hatayama STARC, Japan
Terumine Hayashi Mie University, Japan
Hao-Chiao Hong National Chiao Tung University, Taiwan
Jin-Hua Hong National University of Kaohsiung, Taiwan
Michael S. Hsiao Virginia Tech, USA
Chun-Lung Hsu National Dong Hwa University, Taiwan
Yu Hu Institute of Computing Technology, CAS, China
Chih-Tsun Huang National Tsing Hua University, Taiwan
Jiun-Lang Huang National Taiwan University, Taiwan
Tsung-Chu Huang National Changhua University of Education, Taiwan
Yu Huang Mentor Graphics, USA
Tomoo Inoue Hiroshima City University, Japan
Wen-Ben Jone University of Cincinnati, USA
Rohit Kapur Synopsys, USA
Seiji Kajihara Kyushu Institute of Technology, Japan
Sungho Kang Yonsei University, Korea
Jishun Kuang Hunan University, China
Erik Larsson Linkoping University, Sweden
Kuen-Jong Lee National Cheng Kung University, Taiwan
Chien-Mo James Li National Taiwan University, Taiwan

Call For Papers
The Seventeenth Asian Test Symposium
November 24-27, 2008, Keio Plaza Hotel Sapporo, Sapporo, JAPAN

Original contributions on testing are solicited. Topics of interest include, but are not limited to, the following categories:

Automatic Test Generation / Fault Simulation
Design for Testability / DfX
Built-In Self-Test
Test Data Compression
Delay Testing
Design Verification
Low-power Testing
Defect-Based Testing / IDDX Testing
Fault Modeling & Diagnosis
Memory Test / FPGA Test
Analog and Mixed-Signal Test
RF Testing
High-Speed I/O Test
System-on-a-Chip Test
System-in-Package Test
Board and System Test
On-line Testing
Network Protocol Testing / NoC Testing
Software Testing
Economics of Test
Key Dates
Submission deadline: May 18, 2009
Notification of acceptance: July 10, 2009
Camera-ready copy: August 10, 2009
Symposium: November 23-26, 2009

The ATS'09 Program Committee invites original, unpublished paper submissions on the above topics. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-words abstract and five keywords are also required. All submissions are to be made electronically through the ATS'09 website. Electronic submissions in PDF files are strongly recommended. Detailed instructions for submissions are to be found at the ATS'09 website.
The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (6 pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.

Industrial Session
This session will address a wide range of practical problems in IC, board and system test, diagnosis, failure analysis, design verification, and so on.

The session will consist of short oral presentations.
A one or two pages of abstract is required for submission.
Each submission should also include the complete address and designate a contact person and a presenter.
If accepted, a two-page summary will be included in the final proceedings.
Abstract submissions should be emailed to Industry Chair: Dr. Wu-Tung Cheng ([email protected])

Advance Program PDF download:

High resolution

Advance Program:

Nov. 23, 2009

9:00-12:00 Tutorial 1
Power-Aware Testing and Test Strategies for Low Power Devices

13:30-16:30 Tutorial 2
System-in-Package Test Strategies

Nov. 24, 2009

9:00-10:30 Plenary Session 1

9:00-9:20 Opening Remarks

9:20-9:55 Keynote Speech 1
Testing Challenges for Emerging Nanotechnologies
Niraj K. JHA (Princeton University, USA)

9:55-10:30 Keynote Speech 2
Wireless Testing and 3D Integrated Devices: Can They Save Our Jobs?
Cheng-Wen WU (Industrial Technology Research Institute, Taiwan)

10:50-12:00 Plenary Session 2

10:50-11:25 Keynote Speech 3
Can innovations in Test serve as a beacon of light in a dark economy?
Sanjiv TANEJA (Cadence Design Systems, USA)

11:25-12:00 Keynote Speech 4
Challenges and Solutions for Testing TSV-Based 3D-SICs
Erik Jan MARINISSEN (IMEC, Belgium)

13:10-14:30 Session 3A: BIST

CA Based Built-In Self-Test Structure For SoC
Sukanta DAS, Biplab K SIKDAR (Bengal Engineering and Science University, Shibpur - India)

A Random Jitter RMS Estimation Technique for BIST Applications
Jae Wook LEE, Ji Hwan CHUN, Jacob ABRAHAM (The University of Texas at Austin - USA)

A Novel Seed Selection Algorithm for Test Time Reduction in BIST
Rupsa CHAKRABORTY, Dipanwita ROY CHOWDHURY (IIT, Kharagpur - India)

Logic BIST Architecture for System-Level Test and Diagnosis
Jun QIAN (Cisco Systems, Inc. - USA), Xingang WANG, Qinfu YANG, Fei ZHUANG, Junbo JIA, Xiangfeng LI, Yuan ZUO, Jayanth MEKKOTH, Jinsong LIU (SynTest Technologies, Inc. - China), Hao-Jan CHAO (SynTest Technologies, Inc. - Taiwan), Shianling WU, Huafeng YANG, Lizhen YU, FeiFei ZHAO, Laung-Terng WANG (SynTest Technologies, Inc. - USA)

13:10-14:30 Session 3B: Fault Diagnosis

Fault Diagnosis under Transparent-Scan
Irith POMERANZ (Purdue University - USA), Sudhakar REDDY (University of Iowa - USA)

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns
Yu HUANG, Wu-Tung CHENG, Ruifeng GUO, Ting-Pu TAI (Mentor Graphics Corporation - USA), Feng-Ming KUO, Yuan-Shih CHEN (Taiwan Semiconductor Manufacturing Company - Taiwan)

On Improving Diagnostic Test Generation for Scan Chain Failures
Xun TANG (University of Iowa - USA), Ruifeng GUO, Wu-Tung CHENG (Mentor Graphics Corporation - USA), Sudhakar REDDY (University of Iowa - USA), Yu HUANG (Mentor Graphics Corporation - USA)

On Scan Chain Diagnosis for Intermittent Faults
Dan ADOLFSSON (NXP Semiconductors - Netherlands), Joanna SIEW (Philips Applied Technologies - Netherlands), Erik Jan MARINISSEN (IMEC - Belgium), Erik LARSSON (Linko¨pings Universitet - Sweden)

13:10-14:30 Session 3C: Analog and Mixed-signal Testing

Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique
Jin-Fu LIN, Soon-Jyh CHANG (National Cheng-Kung University - Taiwan)

Multi-Tone Testing of Linear and Nonlinear Analog Circuits using Polynomial Coefficients
Suraj SINDIA, Virendra SINGH (Indian Institute of Science - India), Vishwani AGRAWAL (Auburn University - USA)

Low Cost Dynamic Test Methodology for High Precision ΣΔ ADCs
S. KOOK, H. CHOI, V. NATARAJAN, A. CHATTERJEE (Georgia Tech - USA), A. GOMES, S. GOYAL, L. JIN (National Semiconductor Corporation - USA)

Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits
Shiue-Tsung SHEN, Wei-Hsiao LIU, En-Hua MA, James Chien-Mo LI, I-Chun CHENG (National Taiwan University - Taiwan)

14:45-16:05 Session 4A: Industrial Session

Scan Compression Implementation in Industrial Design - Case Study
Dragon HSU (Ralink), Ron PRESS (Mentor Graphics Corp. - USA)

Calibration as a functional test: An ADC case study
Hsiu-Ming (Sherman) CHANG (ITRI), Kuan-Yu LIN, Kwang-Ting (Tim) CHENG

Customized Algorithms for High Performance Memory Test in Advanced Technology Node
Shomo CHEN (Trident), Ning HUANG, Ting-Pu TAI, Actel NIU

A Practical DFT Approach for Complex Low Power Designs
Augusli KIFLI (Faraday), Y.W. CHEN, Y.W. TSAY, K.C. WU

DFT Challenges in Next Generation Multi-media IP
Vishwanath S, Mukund MITTAL (TI), Subrangshu DAS

Yield Ramp up by Scan Chain Diagnosis
Feng-Ming KUO (TSMC), Yuan-Shih CHEN (Taiwan Semiconductor Manufacturing Company - Taiwan)

14:45-16:05 Session 4B: Low-Power Testing

CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing
Kazunari ENOKIMOTO, Xiaoqing WEN, Yuta YAMATO, Kohei MIYASE (Kyushu Institute of Technology - Japan), Hiroaki SONE (Fukuoka Industry, Science & Technology Foundation - Japan), Seiji KAJIHARA (Kyushu Institute of Technology - Japan), Masao ASO, Hiroshi FURUKAWA (NEC Micro Systems - Japan)

New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
Jiann-Chyi RAU, Tsung-Tang CHEN, Wei-Lin LI, Po-Han WU (Tamkang University - Taiwan)

Deterministic Built-in Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing
Lung-Jen LEE, Wang-Dauh TSENG, Rung-Bin LIN, Chi-Wei YU (Yuan Ze University - Taiwan)

14:45-16:05 Session 4C: On-Line Testing and Silicon Debug

Low Overhead Time-Multiplexed Online Checking: A Case Study of an H.264 Decoder
Ming GAO, Kwang-Ting CHENG (University of California, Santa Barbara - USA)

A FPGA-based Reconfigurable Software Architecture for Highly Dependable Systems
Alberto SCIONTI, Stefano DI CARLO, Paolo PRINETTO (Politecnico di Torino - Italy)

Using Non-Trivial Logic Implications for Trace Buffer-based Silicon Debug
Sandesh PRABHAKAR, Michael HSIAO (Virginia Tech - USA)

A Post-silicon Debug Support Using High-level Design Description
Yeonbok LEE, Tasuku NISHIHARA, Takeshi MATSUMOTO, Masahiro FUJITA (The University of Tokyo - Japan)

16:20-17:40 Session 5A: Delay Testing

A Low Overhead On-chip Path Delay Measurement Circuit
Songwei PEI, Huawei LI, Xiaowei LI (Chinese Academy of Sciences - China)

An Adaptive Test for Parametric Faults Based on Statistical Timing Information
Michihiro SHINTANI, Kazumi HATAYAMA (Semiconductor Technology Academic Research Center - Japan), Takashi SATO (Kyoto University - Japan), Takumi UEZONO (Tokyo Institute of Technology - Japan)

A Delay Measurement Technique Using Signature Registers
Kentaroh KATOH, Toru TANABE, Haque ZAHIDUL, Kazuteru NAMBA, Hideo ITO (Chiba University - Japan)

Functional Built-in Delay Binning and Calibration Mechanism for on-Chip at-Speed Self Test
Chen-I CHUNG, Jyun-Sian JHOU, Ching-Hwa CHENG, Sih-Yan LI (Feng-Chia University - Taiwan)

16:20-17:40 Session 5B: Test Generation (I)

A Practical Approach to Threshold Test Generation for Error Tolerant Circuits
Hideyuki ICHIHARA, Kenta SUTOH, Yuki YOSHIKAWA, Tomoo INOUE (Hiroshima City University - Japan)

Speeding up SAT-based ATPG using Dynamic Clause Activation
Stephan EGGERSGLUESS, Daniel TILLE, Rolf DRECHSLER (University of Bremen - Germany)

N-distinguishing Tests for Enhanced Defect Diagnosis
Gang CHEN, Janusz RAJSKI (University of Iowa - USA), Sudhakar REDDY (University of Iowa - USA), Irith POMERANZ (Purdue University - USA)

Dynamic Compaction in SAT-Based ATPG
Alejandro CZUTRO, Ilia POLIAN, Piet ENGELKE (Albert-Ludwigs-University - Germany), Sudhakar REDDY (University of Iowa - USA), Bernd BECKER (Albert-Ludwigs-University - Germany)

16:20-17:40 Session 5C: System Test

SIRUP: Switch Insertion in RedUndant Pipeline Structures for Yield and Yield/Area Improvement
Mohammad MIRZA-AGHATABAR, Melvin BREUER, Sandeep GUPTA (University of Southern California - USA)

Transaction Level Modeling and Design Space Exploration for SOC Test Architectures
Chin-Yao CHANG, Chih-Yuan HSIAO, Kuen-Jong LEE (National Cheng Kung University - Taiwan), Alan SU (Global Unichip - Taiwan)

Efficient Software-based Self-test Methods for Embedded Digital Signal Processors
Jun-Jie ZHU, Wen-Ching LIN, Jheng-Hao YE, Ming-Der SHIEH (National Cheng Kung University - Taiwan)

Nov. 25, 2009

9:00-10:20 Session 6A: Panel Session (I):
Is Low Power Testing Necessary? What does the Test Industry Truly Need? --> Real Issues and Available Solutions
Anis UZZAMAN (Cadence Design Systems, Inc. - USA)

9:00-10:20 Session 6B: DFT

A Scalable Scan Architecture for Godson-3 Multicore Microprocessor
Zichu Qi, Hui LIU, Xiangku LI, Da WANG, Yinhe HAN, Huawei LI, Weiwu HU (Chinese Academy of Sciences - China)

Kiss the Scan Goodbye: A Non-Scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time
Michael HSIAO, Mainak BANGA (Virginia Tech - USA)

Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction under Output Constraint
Katherine Shu-Min LI, Yu-Chen HUNG, Jr-Yang HUANG (National Sun Yat-Sen University - Taiwan)

Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing
Deepak K.G., Robinson REYNA, Virendra SINGH, Adit SINGH (Indian Institute of Science - India)

9:00-10:20 Session 6C: RF and Analog Testing

BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search
Vishwanath NATARAJAN, Shyam Kumar DEVARAKOND, Shreyas SEN, Abhijit CHATTERJEE (Georgia Institute of Technology - USA)

Self-Calibrating Embedded RF Down-Conversion Mixers
Abhilash GOYAL, Madhavan SWAMINATHAN, Abhijit CHATTERJEE (Georgia Institute of Technology - USA)

A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis
Manuel J. BARRAGAN, Rafaella FIORELLI, Diego VAZQUEZ, Adoracion RUEDA, Jose L. HUERTAS (Universidad de Sevilla - Spain)

Exploiting zero-crossing for the analysis of FM modulated analog/RF signals using digital ATE
Nicolas POUS (LIRMM & Verigy - France), Florence AZAIS, Laurent LATORRE, Pascal NOUET (LIRMM - France), Jochen RIVOIR (Verigy - Germany)

10:40-12:00 Session 7A: SoC Test

IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency
Katherine Shu-Min LI, Yi-Yu LIAO, Yuo-Wen LIU, Jr-Yang HUANG (National Sun Yat-Sen University - Taiwan)

Multiple-Core under Test Architecture for HOY Wireless Testing Platform
Sung-Yu CHEN, Ying-Yen CHEN, Jing-Jia LIOU (National Tsing Hua University - Taiwan)

Partition Based SoC Test Scheduling with Thermal and Power Constraints under Deep Submicron technologies
Chunhua YAO, Kewal K. SALUJA, Parameswaran RAMANATHAN (University of Wisconsin-Madison - USA)

Test Integration for SOC Supporting Very Low-Cost Testers
Chun-Chuan CHI, Chih-Yen LO, Te-Wen KO, Cheng-Wen WU (National Tsing Hua University - Taiwan)

10:40-12:00 Session 7B: Test Generation (II)

Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?
Krishna CHAKRAVADHANULA, Vivek CHICKERMANE, Brion KELLER, Patrick GALLAGHER, Anis UZZAMAN (Cadence Design Systems - USA)

New Class of Tests for Open Faults with Considering Adjacent Lines
Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuzo TAKAMATSU (Ehime University - Japan), Koji YAMAZAKI, Toshiyuki TSUTSUMI (Meiji University - Japan), Hiroyuki YOTSUYANAGI, Masaki HASHIZUME (The University of Tokushima - Japan)

Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption
Subhadip KUNDU, Krishna Kumar S., Santanu CHATTOPADHYAY (Indian Institute of Technology Kharagpur - India)

Deterministic Algorithms for ATPG under Leakage Constraints
Goerschwin FEY (University of Bremen - Germany)

10:40-12:00 Session 7C: Test Data Compression

Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power
Jun LIU, Yinhe HAN, Xiaowei LI (Chinese Academy of Sciences - China)

A Multi-Dimensional Pattern Run-Length Method for Test Data Compression
Lung-Jen LEE, Wang-Dauh TSENG, Rung-Bin LIN, Chi-Wei YU

Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage
Hongxia FANG, Krishnendu CHAKRABARTY (Duke University - USA), Rubin PAREKHJI (Texas Instruments - India)

Nov. 26, 2009

9:00-10:20 Session 8A: Panel Session (II):
Testing Embedded Memories in the Nano-Era: Will the existing approaches survive?
Said HAMDIOUI (Delft University of Technology - Netherlands)

9:00-10:20 Session 8B: Fault Modeling & Diagnosis

A Non-intrusive and Accurate Inspection Method for Segment Delay Variabilities
Ying-Yen CHEN, Jing-Jia LIOU (National Tsing Hua University - Taiwan)

Bridging Fault Diagnosis to Identify the Layer of Systematic Defects
Po-Juei CHEN, James Chien-Mo LI (National Taiwan University - Taiwan), Hsing Jasmine CHAO (Taipei Medical University - Taiwan)

Delay Fault Diagnosis in Sequential Circuits

A Partially-Exhaustive Gate Transition Fault Model
Brion KELLER, Dale MEEHL, Anis UZZAMAN (Cadence Design Systems - USA), Richard BILLINGS (AMD - USA)

9:00-10:20 Session 8C: Analog and Mixed-signal Testing

An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing
Chen-Yuan YANG, Xuan-Lun HUANG, Jiun Lang HUANG (National Taiwan University - Taiwan)

LFSR-based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits
Joonsung PARK, Jaeyong CHUNG, Jacob ABRAHAM (The University of Texas at Austin - USA)

A Jitter Characterizing BIST with Pulse-Amplifying Technique
An-Sheng CHAO, Soon-Jyh CHANG (National Cheng Kung University - Taiwan)

A Low-Cost Output Response Analyzer for the Built-in-Self-Test Sigma-Delta Modulator Based on the Controlled Sine Wave Fitting Method
Shao-Feng HUNG, Hao-Chiao HONG, Sheng-Chuan LIANG (National Chiao Tung University - Taiwan)

10:40-12:00 Session 9A: Memory Test

New Developments and Insights in Memory Test Algorithms
A.J. VAN DE GOOR (ComTex - Netherlands), Said HAMDIOUI, Georgi GAYDADJIEV, Zaid AL-ARS (Delft University of Technology - Netherlands)

Testability Exploration of 3-D RAMs and CAMs
Yu-Jen HUANG, Jin-Fu LI (National Central University - Taiwan)

Fault Diagnosis Using Test Primitives in Random Access Memories
Zaid AL-ARS, Said HAMDIOUI (Delft University of Technology - Netherlands)

10:40-12:00 Session 9B: Test Generation (III)

Test Generation for Designs with On-Chip Clock Generators
Xijiang LIN, Mark KASSAB (Mentor Graphics Corp. - USA)

On the Generation of Functional Test Programs for the Cache Replacement Logic
Wilson PEREZ (Universidad del Valle, Universidad Pedago´gicay Tecnolo´gica de Colombia - Colombia), Danilo RAVOTTO, Edgar Ernesto Sanchez SANCHEZ, Matteo SONZA REORDA, Alberto TONDA (Politecnico di Torino - Italy)

Compact Test Generation for Small-Delay Defects Using Testable-Path Information
Dong XIANG, Boxue YIN (Tsinghua University - China), Krishnendu CHAKRABARTY (Duke University - USA)

At-Speed Scan Test Method for the Timing Optimization and Calibration
Kun-Han TSAI, Ruifeng GUO, Wu-Tung CHENG (Mentor Graphics Corp. - USA)

10:40-12:00 Session 9C: Defect-Based Testing

M-IVC: Using Multiple Input Vectors to Minimize Aging-induced Delay
Song JIN, Yinhe HAN, Lei ZHANG, Huawei LI, Xiaowei LI, Guihai YAN (Chinese Academy of Sciences - China)

Analysis of Resistive Bridging Defects in a Synchronizer
Hyoung-Kook KIM, Wen Ben JONE (University of Cincinnati - USA), Laung-Terng WANG, Shianling WU (SynTest Technologies - USA)

On-Chip TSV Testing for 3D IC before Bonding Using Sense Amplification
Po-Yuan CHEN, Cheng-Wen WU (National Tsing Hua University - Taiwan), Ding-Ming KWAI (Industrial Technology Research Institute - Taiwan)

Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
Yubin ZHANG, Lin HUANG, Feng YUAN, Qiang XU (The Chinese University of Hong Kong - Hong Kong)