IEEE COMPUTER SOCIETY SERVICE AWARDS:
Certificate of Appreciation Awards:
Yinghua Min and Hideo Fujiwara, 2001
"for founding and chairing the IEEE RT-Level ATPG and DFT Workshop
in China"
1 October 2001, at ITC'01
Xiaowei Li, 2007
"for serving as General Co-Chair for ATS 2007 and General Chair for
WRTLT 2007"
WRTLT 2003
"An approach to non-scan design for delay fault testability of
controllers"
Tsuyoshi Iwagaki, Satoshi Ohtake and Hideo Fujiwara
WRTLT 2004
"A Test Compression Algorithm for Reducing Test Application Time"
Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara and Tomoo
Inoue
WRTLT 2005
"Acceleration of Test Generation for Sequential Circuits Using
Knowledge Obtained from Synthesis for Testability"
Masato Nakazato, Satoshi Ohtake, Kewal K. Saluja and Hideo
Fujiwara
WRTLT 2006
"An Improved Method of Per-Test X-Fault Diagnosis for
Deep-Submicron LSI Circuits"
Xiaoqing Wen, Yuta Yamato, Kohei Miyase, Seiji Kajihara, and Kozo
Kinoshita
WRTLT 2007
"RTL Don't Care Path Identification and Synthesis for Transforming
Don't Care Paths into False Paths"
Yuki Yoshikawa, Satoshi Ohtake, and Hideo Fujiwara
WRTLT 2008
"Enhancement of Test Environment Generation for Assignment Decision
Diagrams"
Hideo Fujiwara, Chia Yee Ooi, and Yuki Shimizu
WRTLT 2009
"A DFT Method for Functional Scan at RTL"
Marie E. J. Obien and Hideo Fujiwara
WRTLT 2010
"An Approach to Test Scheduling for Asynchronous On-Chip Interconnects Using Integer Programming"
Tsuyoshi Iwagaki, Eiri Takeda and Mineo Kaneko
WRTLT 2011 "Built-in Self-Test for Functional Register-Transfer Level using Assignment Decision Diagram"Norlina Paraman, Chia Yee Ooi, Ahmad Zuri Sha'Ameri and Hideo Fujiwara
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