Certificate of Appreciation Awards:
Yinghua Min and Hideo Fujiwara, 2001
"for founding and chairing the IEEE RT-Level ATPG and DFT Workshop in China"
1 October 2001, at ITC'01
Xiaowei Li, 2007
"for serving as General Co-Chair for ATS 2007 and General Chair for WRTLT 2007"
"An approach to non-scan design for delay fault testability of controllers"
Tsuyoshi Iwagaki, Satoshi Ohtake and Hideo Fujiwara
"A Test Compression Algorithm for Reducing Test Application Time"
Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara and Tomoo Inoue
"Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability"
Masato Nakazato, Satoshi Ohtake, Kewal K. Saluja and Hideo Fujiwara
"An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits"
Xiaoqing Wen, Yuta Yamato, Kohei Miyase, Seiji Kajihara, and Kozo Kinoshita
"RTL Don't Care Path Identification and Synthesis for Transforming Don't Care Paths into False Paths"
Yuki Yoshikawa, Satoshi Ohtake, and Hideo Fujiwara
"Enhancement of Test Environment Generation for Assignment Decision Diagrams"
Hideo Fujiwara, Chia Yee Ooi, and Yuki Shimizu
"A DFT Method for Functional Scan at RTL"
Marie E. J. Obien and Hideo Fujiwara
"An Approach to Test Scheduling for Asynchronous On-Chip Interconnects Using Integer Programming"
Tsuyoshi Iwagaki, Eiri Takeda and Mineo Kaneko